- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 15/02 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
Patent holdings for IPC class G01B 15/02
Total number of patents in this class: 445
10-year publication summary
|
30
|
31
|
33
|
36
|
41
|
44
|
41
|
33
|
29
|
10
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| PaneraTech, Inc. | 31 |
14 |
| Nova Measuring Instruments Inc. | 59 |
14 |
| FUJIFILM Corporation | 27102 |
10 |
| Schlumberger Technology Corporation | 9690 |
8 |
| Pioneer Corporation | 4843 |
8 |
| General Electric Company | 18133 |
7 |
| Commissariat à l'énergie atomique et aux energies alternatives | 10525 |
7 |
| Rigaku Corporation | 379 |
7 |
| Kabushiki Kaisha Toshiba, doing business as Toshiba Corporation | 6275 |
7 |
| KLA Corporation | 1223 |
7 |
| Honeywell International Inc. | 13799 |
6 |
| Applied Materials Israel, Ltd. | 549 |
6 |
| Helmut Fischer GmbH Institut fur Elektronik und Messtechnik | 154 |
6 |
| Sharp Kabushiki Kaisha | 18957 |
6 |
| Samsung Electronics Co., Ltd. | 131630 |
5 |
| Halliburton Energy Services, Inc. | 20165 |
5 |
| Hitachi High-Technologies Corporation | 2034 |
5 |
| KLA-Tencor Corporation | 2574 |
5 |
| Tiama | 78 |
5 |
| Toshiba Infrastructure Systems & Solutions Corporation | 957 |
5 |
| Other owners | 302 |